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Emerging Nanotech: Test, Defect Tolerance, and Reliabiltiy

 
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mayo
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PostPosted: 22/10/2011 20:19    Post subject: Emerging Nanotech: Test, Defect Tolerance, and Reliabiltiy Reply with quote

Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability
408 pages | Sep 22 2010 |ISBN:038774746X | PDF | 5.5 Mb

Emerging Nanotech: Test, Defect Tolerance, and Reliabiltiy Emerging Nanotech: Test, Defect Tolerance, and Reliabiltiy

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

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mojo
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PostPosted: 06/05/2012 18:23    Post subject: Reply with quote

Emerging Nanotech: Test, Defect Tolerance, and Reliabiltiy Emerging Nanotech: Test, Defect Tolerance, and Reliabiltiy
MEMS and Nanotechnology, Volume 4 represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.
The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials; Optical Measurements, Modeling and, Metrology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual Stress.


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